发明名称 Plasma treating apparatus and plasma treating method
摘要 In a plasma treating apparatus for carrying out a plasma treatment over a silicon wafer 6 having a protective tape 6a stuck to a circuit formation face, the silicon wafer 6 is mounted on a mounting surface 3d which is provided on an upper surface of a lower electrode 3 formed of a conductive metal with the protective tape 6a turned toward the mounting surface 3d. When a DC voltage is to be applied to the lower electrode 3 by a DC power portion 18 for electrostatic adsorption to adsorb and hold the silicon wafer 6 onto the lower electrode 3 in the plasma treatment, the protective tape 6a is utilized as a dielectric for the electrostatic adsorption. Consequently, the dielectric can be thinned as much as possible and the silicon wafer 6 can be held by a sufficient electrostatic holding force.
申请公布号 US2003037882(A1) 申请公布日期 2003.02.27
申请号 US20020227930 申请日期 2002.08.26
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 ARITA KIYOSHI;IWAI TETSUHIRO;TERAYAMA JUNICHI
分类号 H01L21/3065;H01L21/683;(IPC1-7):H01L21/306;C23F1/00;C23C16/00 主分类号 H01L21/3065
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