发明名称 METHOD AND APPARATUS FOR PHOTON ACTIVATION POSITRON ANNIHILATION ANALYSIS
摘要 Non-destructive testing apparatus according to one embodiment of the invention comprises a photon source. The photon source produces photons having predetermined energies and directs the photons toward a specimen being tested. The photons from the photon source result in the creation of positrons within the specimen being tested. A detector positioned adjacent the specimen being tested detects gamma rays produced by annihilation of positrons with electrons which are indicative of a material characteristic of the specimen being tested.
申请公布号 WO03016947(A2) 申请公布日期 2003.02.27
申请号 WO2002US08980 申请日期 2002.03.06
申请人 BECHTEL BWXT IDAHO, LLC 发明人 AKERS, DOUGLAS, W.
分类号 G01T;G01T1/29;G21G1/12 主分类号 G01T
代理机构 代理人
主权项
地址