| 摘要 |
<p>Method and apparatus for circuit testing with ring-connected test instrument modules. A system for controlling one or more test instruments (108, 110) to test one or more integrated circuits includes a master clock (107) and a controller (102). The test instruments are connected to form a communication ring (114). The master clock (107) is connected to each test instrument (108, 110) and provides a clock signal (117) to the one or more test instruments (108, 110). The controller (102) is connected to the communication ring (114) and is configured to align counters of test instruments (108, 110) to derive a common clock time value from the clock signal. The controller (102) is further configured to generate and send data words into the communication ring (114) to carry the data words to each test instrument (108, 110). The data words includes at least one data word specifying a test event to be performed, a common clock time value, and at least one of the test instruments (108, 110).</p> |
