发明名称 TECHNIQUE FOR ANALYSIS OF CHARGED PARTICLES IN HYPERBOLOID MASS SPECTROMETER
摘要 FIELD: mass spectrometry. SUBSTANCE: invention can find use in development of devices with high efficiency of containment of charged particles in working space of analyzer. According to proposed technique for analysis of charged particles in hyperboloid mass spectrometer charge particles with chosen specific charge are compressed to center of electron system or to its symmetry axis by way of selection of phase of injection of particles into electric field and field parameters under which selected particles travel along base trajectories in time of containment. EFFECT: increased signal-to-noise ratio and substantially improved analytical characteristics of device for realization of technique. 1 dwg
申请公布号 RU2199793(C2) 申请公布日期 2003.02.27
申请号 RU19980119225 申请日期 1998.10.23
申请人 SHERETOV EHRNST PANTELEJMONOVICH 发明人 SHERETOV EH.P.;KARNAV T.B.
分类号 H01J49/42;(IPC1-7):H01J49/42 主分类号 H01J49/42
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