| 摘要 |
PROBLEM TO BE SOLVED: To keep the pin position hardly changeable against stresses, and reduce the conductor loss of a wiring, when fixing a contact probe and in its manufacturing process. SOLUTION: The contact probe 10 has a plurality of pattern wirings 12, formed on the surface of a film 11 with their top end portions disposed at the top end of the film, thereby forming contact pins 12a. At least the middle portions of the pattern wirings are made of a metal material, having flexibility higher than that of the metallic material of the top end portions forming the contact pins.
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