发明名称 |
METHOD FOR MEASURING CHARACTERISTICS OF LIQUID CRYSTAL DISPLAY DEVICE AND APPARATUS USED FOR THE MEASUREMENT |
摘要 |
PROBLEM TO BE SOLVED: To make highly accurately measurable the azimuth anchoring strength of even an alignment layer with a large anchoring strength. SOLUTION: A cell for measurement has a pair of substrates which are opposed to each other via a liquid crystal and in which alignment layers are formed in surfaces on the side of the liquid crystal. The method for measuring the characteristics of a liquid crystal display device and an apparatus used for the measurement are provided with both a process for measuring each of the twist angleϕ1 of the liquid crystal when a nematic liquid crystal containing chiral molecules is sealed in the cell for measurement and the twist angleϕ2 of the liquid crystal when a nematic liquid crystal not containing chiral molecules is sealed in the same cell as the cell for measurement and a process for computing the difference between the twist angleϕ1 and the twist angleϕ2 .
|
申请公布号 |
JP2003057147(A) |
申请公布日期 |
2003.02.26 |
申请号 |
JP20010243926 |
申请日期 |
2001.08.10 |
申请人 |
HITACHI LTD |
发明人 |
HASEGAWA SHINJI |
分类号 |
G01N21/21;G01M11/00;G02F1/13;(IPC1-7):G01M11/00 |
主分类号 |
G01N21/21 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|