发明名称 METHOD FOR MEASURING CHARACTERISTICS OF LIQUID CRYSTAL DISPLAY DEVICE AND APPARATUS USED FOR THE MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To make highly accurately measurable the azimuth anchoring strength of even an alignment layer with a large anchoring strength. SOLUTION: A cell for measurement has a pair of substrates which are opposed to each other via a liquid crystal and in which alignment layers are formed in surfaces on the side of the liquid crystal. The method for measuring the characteristics of a liquid crystal display device and an apparatus used for the measurement are provided with both a process for measuring each of the twist angleϕ1 of the liquid crystal when a nematic liquid crystal containing chiral molecules is sealed in the cell for measurement and the twist angleϕ2 of the liquid crystal when a nematic liquid crystal not containing chiral molecules is sealed in the same cell as the cell for measurement and a process for computing the difference between the twist angleϕ1 and the twist angleϕ2 .
申请公布号 JP2003057147(A) 申请公布日期 2003.02.26
申请号 JP20010243926 申请日期 2001.08.10
申请人 HITACHI LTD 发明人 HASEGAWA SHINJI
分类号 G01N21/21;G01M11/00;G02F1/13;(IPC1-7):G01M11/00 主分类号 G01N21/21
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