发明名称 |
DEVICE FOR INSPECTING ELECTRIC CONNECTION |
摘要 |
PROBLEM TO BE SOLVED: To provide an electric connection inspection device having micro-fine structure excellent in durability, without worsening a degree of freedom for selection of using materials in view point of restriction in a product function accompanied to aptitudes of an electric characteristic such as an electric resistance and a physical property such as an internal stress, and restriction in production such as the propriety of using a plating method. SOLUTION: In this electric connection inspection device having a plural contact terminals and for contacting electrically with an inspection object to input and output signals, a coating layer having 3μor more of thickness and having a Young's modulus higher than that of a wiring base material layer is provided on a surface of the wiring base material layer positioned in a tip part of the contact terminal.
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申请公布号 |
JP2003057310(A) |
申请公布日期 |
2003.02.26 |
申请号 |
JP20010247959 |
申请日期 |
2001.08.17 |
申请人 |
KOBE STEEL LTD;GENESIS TECHNOLOGY KK |
发明人 |
HIRANO TAKAYUKI;GOTO YASUSHI;YONEDA YASUSHI;IWAMURA EIJI;TAKEUCHI SUSUMU |
分类号 |
G01R31/26;G01R1/073;G01R31/28;H01L21/66;H05K3/00;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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