发明名称 SEMICONDUCTOR PARTICLE-IDENTIFYING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor particle-identifying apparatus that utilizes a semiconductor particle composed of a plurality of types of semiconductor materials, that can individually identify particles, even if the types of a substance to be detected is very large without being affected by fluorescent signals for detecting organic substances in the detection of the organism substances, and can perform multiple analysis that can be applied to a very large number of affinity combinations. SOLUTION: The semiconductor particle-identifying apparatus comprises a pipeline that is passed through the inside of semiconductor particles, a magnetic field generation means for generating a magnetic field in the pipeline, and an eddy current detection means for detecting eddy currents that are generated in the semiconductor particles in the pipeline, and then identifies the semiconductor particles using the value of the eddy current that is detected by the eddy current detection means.
申请公布号 JP2003057207(A) 申请公布日期 2003.02.26
申请号 JP20010242636 申请日期 2001.08.09
申请人 OLYMPUS OPTICAL CO LTD 发明人 MURAKAMI MINEYUKI
分类号 G01N33/48;C12M1/00;G01N27/04;G01N27/72;(IPC1-7):G01N27/72 主分类号 G01N33/48
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