| 摘要 |
A fail-safe circuit for a pair of differential input lines detects when one or both lines are open. Each line has a pull-up of a switched p-channel transistor in series with a resistor or another p-channel transistor that has its effective resistance controlled by a gate bias. The gate of the switched p-channel transistor is driven to ground when power is applied to the gate of a grounding n-channel transistor. When power is off, a p-channel connecting transistor charges the gate node from the differential input line when a positive voltage is applied to the input line, such as during a leakage test. Charging the gate node prevents the switched p-channel transistor from turning on, blocking a leakage current path through the pull-up. An N-well bias circuit can be added, which connects the N-well under p-channel transistors to power or the gate node or the input line.
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