发明名称 SUBSTRATE CLEANING APPARATUS AND SUBSTRATE CLEANING METHOD
摘要 PROBLEM TO BE SOLVED: To well clean the surface of a substrate. SOLUTION: Before the cleaning of the electrode side of a substrate 2 with a substrate cleaning mechanism is started, the elapsed time t measured by a measuring device 25 after the completion of dripping of a solvent 14 onto a cleaning cloth 8 is compared, by a comparison judgment section 27, with an allowable time T memorized in a memory section 26 in order to judge whether the elapsed time t measured by the measuring device 25 exceeds the allowable time T or not. When the elapsed time is judged to be longer than the allowable time T, the solvent 14 is dripped again onto the cleaning cloth 8.
申请公布号 JP2003053281(A) 申请公布日期 2003.02.25
申请号 JP20010250526 申请日期 2001.08.21
申请人 SHIBAURA MECHATRONICS CORP 发明人 AOYAMA TAKESHI
分类号 G02F1/1333;B08B1/00;B08B3/08;B08B7/04;H01J11/44;H01J11/46;(IPC1-7):B08B3/08;H01J11/02 主分类号 G02F1/1333
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