发明名称 Integrated optical interrogation of micro-structures
摘要 The invention is an integrated optical sensing element for detecting and measuring changes in position or deflection. A deflectable member, such as a microcantilever, is configured to receive a light beam. A waveguide, such as an optical waveguide or an optical fiber, is positioned to redirect light towards the deflectable member. The waveguide can be incorporated into the deflectable member or disposed adjacent to the deflectable member. Means for measuring the extent of position change or deflection of the deflectable member by receiving the light beam from the deflectable member, such as a photodetector or interferometer, receives the reflected light beam from the deflectable member. Changes in the light beam are correlated to the changes in position or deflection of the deflectable member. A plurality of deflectable members can be arranged in a matrix or an array to provide one or two-dimensional imaging or sensing capabilities.
申请公布号 US6525307(B1) 申请公布日期 2003.02.25
申请号 US19990397552 申请日期 1999.09.16
申请人 UT-BATTELLE, LLC 发明人 EVANS, III BOYD M.;DATSKOS PANAGIOTIS G.;RAJIC SLOBODAN
分类号 G01B7/34;G01J1/04;G12B21/08;(IPC1-7):G01J1/04 主分类号 G01B7/34
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