发明名称 |
BACK-SURFACE CLEANING METHOD AND APPARATUS, OPERATION CONTROL METHOD AND APPARATUS, AND COMPUTER PROGRAM |
摘要 |
PURPOSE: To properly purify the back-surface of a silicon wafer formed with an integrated circuit; using Cu on the surface. CONSTITUTION: A contaminants, such as Cu or the like adhered to a back surface of a silicon wafer 50 is first removed, by cleaning it with an acid solution, and a compound generated on the back surface of the silicon wafer 50, when cleaning with this acid solution is removed by cleaning with pure water mixed with ozone.
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申请公布号 |
KR20030015850(A) |
申请公布日期 |
2003.02.25 |
申请号 |
KR20020047446 |
申请日期 |
2002.08.12 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
HAGIMOTO YOSHIYA;SASAKI YASUSHI |
分类号 |
C02F1/78;B08B3/02;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 |
主分类号 |
C02F1/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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