发明名称 BACK-SURFACE CLEANING METHOD AND APPARATUS, OPERATION CONTROL METHOD AND APPARATUS, AND COMPUTER PROGRAM
摘要 PURPOSE: To properly purify the back-surface of a silicon wafer formed with an integrated circuit; using Cu on the surface. CONSTITUTION: A contaminants, such as Cu or the like adhered to a back surface of a silicon wafer 50 is first removed, by cleaning it with an acid solution, and a compound generated on the back surface of the silicon wafer 50, when cleaning with this acid solution is removed by cleaning with pure water mixed with ozone.
申请公布号 KR20030015850(A) 申请公布日期 2003.02.25
申请号 KR20020047446 申请日期 2002.08.12
申请人 NEC ELECTRONICS CORPORATION 发明人 HAGIMOTO YOSHIYA;SASAKI YASUSHI
分类号 C02F1/78;B08B3/02;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 主分类号 C02F1/78
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