发明名称 |
DEVICE FOR INSPECTING ELECTRIC CONNECTION |
摘要 |
PURPOSE: To provide an electric connection inspection device having micro-fine structure excellent in durability, to which an electrode material is hardly deposited and flocculated, without worsening a degree of freedom for selection of using materials in view point of restriction in a product function accompanied to aplitudes of an electric characteristic such as an electric resistance and a physical property such as an internal stress, and restriction in production such as the propriety of using a plating method. CONSTITUTION: In this electric connection inspection device having a plurality of contact terminals and for contacting electrically with an inspection object to input and output signals, a coating film of the second layer having 1x10¬-4 Ωcm or less of specific resistance and having a Young's modulus higher than that of a wiring base material layer is formed on a surface of the wiring base material layer positioned in a tip part of the contact terminal, and a coating film of the third layer having a low flocculating property is formed further on a surface of the second layer.
|
申请公布号 |
KR20030015872(A) |
申请公布日期 |
2003.02.25 |
申请号 |
KR20020048319 |
申请日期 |
2002.08.16 |
申请人 |
GENESIS TECHNOLOGY INC.;KABUSHIKI KAISHA KOBE SEIKO SHO |
发明人 |
GOTOH HIROSHI;HIRANO TAKAYUKI;IWAMURA EIJI;TAKEUCHI SUSUMU;YONEDA YASUJI |
分类号 |
G01R31/26;G01R1/073;G01R31/28;H01L21/66;H05K3/00;(IPC1-7):H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|