| 摘要 |
PROBLEM TO BE SOLVED: To provide a microcontroller that can speed up failure analysis. SOLUTION: When a test signal is inputted to a state-transiting means 8 from the outside, the state transiting means 8 stops an operation clock to be supplied to each part of a controller, also stops each part of the controllers for a CPU 1, a ROM 2, a RAM 3, etc., and transits the microcontroller to a standby mode. Then, FIB processing no longer has to be applied to the microcontroller, in order to forcedly transit the microcontroller to a standby mode contrary to the conventional manner, so that a failure analysis can be speeded up. |
