| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an analyzing method and an analyzing device that do not restrict a sample form, do not produce cross over with the information of pollutant, and can sufficiently increase the concentration of an analyzed object. SOLUTION: This method for analyzing an adsorbing material on the surface of a sample in an infrared method or a Raman method comprises (1) a process of desorbing as gas the adsorbing material from the sample by heating the sample in vacuum, (2) a process of condensing and adsorbing the desorbed adsorbing material gas on a cooling substrate, and (3) a process of analyzing the adsorbing material on the cooling substrate in the infrared method or the Raman method.</p> |
