发明名称 SCANNING MAGNETIC MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning magnetic microscope improved in detecting sensitivity by enhancing the efficiency of detecting the magnetic field generated from a measured object, and the change of the magnetic field, and a noise eliminating function. SOLUTION: A laser light source 7 is disposed on the side of a pickup coil 3 to the measured object 4, and transparent windows WA, WB, WC, WD are fitted into vacuum heat-insulating walls 1, 2. Irradiated laser beams L pass through a hollow part of the pickup coil 3 serving as a detecting part of a magnetic detector, to irradiate the surface of the measured object 4. The local magnetic field of the measured object 4 excited by the surface of the measured object, and the change of the magnetic field can thereby be efficiently detected by the pickup coil 3.
申请公布号 JP2003050229(A) 申请公布日期 2003.02.21
申请号 JP20010238553 申请日期 2001.08.07
申请人 SHIMADZU CORP 发明人 TOMITA TSUKASA;YOSHIDA KEIICHI
分类号 G01R33/035;G01N27/72;(IPC1-7):G01N27/72 主分类号 G01R33/035
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