| 摘要 |
PROBLEM TO BE SOLVED: To provide a measuring method and instrument for measuring the electromagnetic conversion characteristic in the condition approximated to the actual use state with the bar-shaped or the wafer-like state. SOLUTION: The deflection generating on a cantilever 41 is detected by an inter-atomic force between a probe 44 of the cantilever 41 and the air bearing surface 13 of the thin-film magnetic head Q in the manner of using an atomic force microscope(AFM) 4 provided with the cantilever 41 mounting a magnetic field generating element 45 thereon. On the basis of this detected signal S1, the cantilever 41 is controlled so that the deflection of the cantilever 41 is corresponded to the atomic force. The electromagnetic conversion is performed for the generated magnetic field of the magnetic field generating element 45 by a reading element of the thin-film magnetic head Q, then the reading characteristic is measured by an electromagnetic conversion signal S3 supplied from the reading element.
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