发明名称 METHOD FOR ABSOLUTE CALIBRATION OF INTERFEROMETER
摘要 PROBLEM TO BE SOLVED: To provide a method for absolute calibration of an interferometer. SOLUTION: In the case of a method for the absolute calibration in an interferometer that has an optical member, that inverts an incidence spherical wave by itself or via a mirror and uses an output spherical wave, at least four measurement procedures measure wavefront aberration W. The optical member is measured at least at two different rotation angle positions inside and outside a focus position, namely at least four measurement positions. Additionally measurement can be made at diaphragm positions (focus 3) via the mirror.
申请公布号 JP2003050185(A) 申请公布日期 2003.02.21
申请号 JP20020150811 申请日期 2002.05.24
申请人 CARL ZEISS SEMICONDUCTOR MANUFACTURING TECHNOLOGIES AG 发明人 FREIMANN ROLF;REICHELT STEPHAN;MAYER MAXIMILIAN
分类号 G01B9/02;G01J9/02;G01M11/02;(IPC1-7):G01M11/02 主分类号 G01B9/02
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