发明名称 Method for removing the photoresist layer of ion-implanting process
摘要 First of all, a semiconductor substrate is provided. Then a photoresist layer is formed on the semiconductor substrate, and the photoresist layer is defined to form a pre-region. Afterward, an ion-implanting process is performed by using the photoresist layer as an ion-implanting mask to form an ion-implanting region in the semiconductor substrate of the pre-region. Because the surface of the photoresist layer is bombarded with ions, a hard mask is formed on the photoresist layer. Subsequently, an etching process with fluorine-based plasma is performed to strip the hard mask. An ashing process with the temperature about, but more than 250° C. is performed by way of an oxide plasma process to remove the photoresist layer. Finally, a soak process with a sulfuric acid and a cleaning process with the RAC are performed to remove the remainder of the photoresist layer.
申请公布号 US2003036284(A1) 申请公布日期 2003.02.20
申请号 US20010930853 申请日期 2001.08.16
申请人 CHOU YU-REN;LIU JING-HUNG 发明人 CHOU YU-REN;LIU JING-HUNG
分类号 H01L21/266;H01L21/311;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/266
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