发明名称 Method and apparatus for adjusting characteristics of electron source, and method for manufacturing electron source
摘要 A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, and a method for manufacturing the electron source include the step of applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more times according to a characteristic of the electron-emitting device, wherein the voltage for adjustment is selected from a plurality of voltages having discrete values according to the characteristic of the electron-emitting device, and a number of applying times of the pulse is determined according to the characteristic of the electron-emitting device and the selected voltage.
申请公布号 US2003036331(A1) 申请公布日期 2003.02.20
申请号 US20020209876 申请日期 2002.08.02
申请人 AOKI SHUJI;OGUCHI TAKAHIRO 发明人 AOKI SHUJI;OGUCHI TAKAHIRO
分类号 G09G3/20;G09G3/22;H01J9/42;(IPC1-7):H01J9/42 主分类号 G09G3/20
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