发明名称 PRODUCTION PATTERN-RECOGNITION ARTIFICIAL NEURAL NET (ANN) WITH EVENT-RESPONSE EXPERT SYSTEM (ES)-YIELDSHIELD<TM>
摘要 Artificial Neural Net (ANN) (350) coupled with an Expert System (ES) (320) which monitors production test plans (310, 320) in real-time is provided. The ANN (350) recognizes and classifies production yield patterns (360) occurring at individual tester, complete test stage, and production line test aggregation and executes a proscribed range of responses. The ANN (350) will automate human statistical analysis and line monitoring functions, identify emerging yield trends, identify proximate cause of a yield-degrading event, classify event severity, and provide conclusional accuracy. The ES (320), based on recognized or inferred conditions provided by the ANN (350), consults its knowledge base and applies cognitive heuristics to execute responses (380) in the manner described by the human expert it is modeled after. These responses may include a summary report electronically to the correct individuals, a voice/pager message to the individuals responsible to react to an event, a visual or audible alarm at the event site, and/or direct adjustment of the production process.
申请公布号 WO03015004(A2) 申请公布日期 2003.02.20
申请号 WO2002US18279 申请日期 2002.06.10
申请人 NOKIA CORPORATION;GVENTER, BRIAN 发明人 GVENTER, BRIAN
分类号 G05B13/02;G05B19/418;G05B23/02;G06N3/04;G21C17/00 主分类号 G05B13/02
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