发明名称 METHODS AND APPARATUS FOR TESTING A SEMICONDUCTOR WITH TEMPERATURE DESOAK
摘要 A semiconductor handling system has a temperature soak assembly to temperature soak a semiconductor structure (e.g., a panel), a test assembly to test the semiconductor structure, and a temperature desoak assembly to temperature desoak the semiconductor structure. The temperature desoak assembly includes (i) a heat sink that defines a surface which is configured to thermally couple with the semiconductor structure, (ii) a fluid guide coupled to the heat sink, and (iii) a fluid controller coupled to the fluid guide. The fluid controller provides a fluid (e.g., room temperature air) which the fluid guide directs over the heat sink to bring a temperature of the heat sink to a temperature of the fluid. This arrangement provides an effective low cost and low power means for temperature desoaking a semiconductor structure.
申请公布号 WO03014753(A2) 申请公布日期 2003.02.20
申请号 WO2002US23696 申请日期 2002.07.24
申请人 TERADYNE, INC. 发明人 PFAHNL, ANDREAS, C.;DUNN, JOHN, J., JR.
分类号 G01R31/28 主分类号 G01R31/28
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