Wirings (5A, 5B) for supplying a power supply voltage to supply a drive voltage to an integrated circuit in a semiconductor chip (3) is so formed as to cover a major surface of the semiconductor chip (3). If the wirings (5A, 5B) are removed so as to analyze the information stored in the semiconductor chip (3), the integrated circuit does not operate to prevent the information analysis. A process detecting circuit for detecting process of the wirings (5A, 5B) is provided. When the process detecting circuit detects process of the wirings (5A, 5B), the integrated circuit is reset. Thus, the security of the information stored in a semiconductor device can be improved.
申请公布号
WO03015169(A1)
申请公布日期
2003.02.20
申请号
WO2002JP06577
申请日期
2002.06.28
申请人
HITACHI, LTD.;HITACHI ULSI SYSTEMS CO., LTD.;MIZUNO, HIROTAKA;MASUMURA, YOSHIO;KON, TAKEO;KAWASHIMA, YUKIO