Testing of DDR-DIMMs using a DQS signal using a circuit that allows expansion of existing test equipment designed for use with SDR (single data rate) DIMMs so that it can be used for testing DDR-DIMMs with DQS signals

摘要

Circuit device (12) for testing an integrated circuit (11), especially a DDR-DIMM using a data query strobe (DQS) signal. Circuit comprises a test signal input (22, 24) for the DQS signal, a reference signal input (18, 20) for input of a reference signal (PDy, PDz) and a comparator (14, 16) for comparison of the test and reference signals and output of a fault signal if indicated by the signal comparison. The fault signal is stored in memory (26, 28), which in turn is connected to a signal output (38). The invention also relates to a corresponding tests system, method and application of the inventive circuit device to testing DDR-DIMMs with a DQS signal.