发明名称 |
Refocusing wavelengths to a common focal plane for electrical trace testing |
摘要 |
The present invention relates to a method and apparatus for testing electrical traces wherein ultraviolet wavelengths from a laser source and visible wavelengths from a scanning camera are focused to a common focal plane. In a first embodiment of the method and apparatus, the wavelengths are commonly focused using an auxiliary lens having a power sufficient to accommodate the difference between the focusing plane of the ultraviolet laser source and the scanning camera. In a second embodiment, the wavelengths are commonly focused by moving the camera optics of the scanning camera relative to its visible light source. Both of these methods and apparatuses employ a fused silica lens system, avoiding the use of calcium fluoride.
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申请公布号 |
US2003034788(A1) |
申请公布日期 |
2003.02.20 |
申请号 |
US20010041649 |
申请日期 |
2001.10.24 |
申请人 |
CUGINI MARIO A.;BRAKLEY JEFF;RAVICH GILBERT NORMAN;FORD ERIC |
发明人 |
CUGINI MARIO A.;BRAKLEY JEFF;RAVICH GILBERT NORMAN;FORD ERIC |
分类号 |
G01R31/265;G01R31/309;(IPC1-7):G01R31/302 |
主分类号 |
G01R31/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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