发明名称 |
Photoresist including a polymer obtained by polycondensation of at least one monomer with acid cleavable groups in its main chain useful in semiconductor technology, e.g. in microchip production |
摘要 |
A photoresist including a polymer obtained by polycondensation of at least one monomer with acid cleavable groups in its main chain, where at least one of the monomers contains one or more fluorine or fluoroalkyl groups, a photoacid builder, and a solvent is new.
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申请公布号 |
DE10135246(A1) |
申请公布日期 |
2003.02.20 |
申请号 |
DE2001135246 |
申请日期 |
2001.07.19 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
ESCHBAUMER, CHRISTIAN;HOHLE, CHRISTOPH;SEBALD, MICHAEL;ROTTSTEGGE, JOERG |
分类号 |
G03F7/004;G03F7/039;(IPC1-7):G03F7/039 |
主分类号 |
G03F7/004 |
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地址 |
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