发明名称 Photoresist including a polymer obtained by polycondensation of at least one monomer with acid cleavable groups in its main chain useful in semiconductor technology, e.g. in microchip production
摘要 A photoresist including a polymer obtained by polycondensation of at least one monomer with acid cleavable groups in its main chain, where at least one of the monomers contains one or more fluorine or fluoroalkyl groups, a photoacid builder, and a solvent is new.
申请公布号 DE10135246(A1) 申请公布日期 2003.02.20
申请号 DE2001135246 申请日期 2001.07.19
申请人 INFINEON TECHNOLOGIES AG 发明人 ESCHBAUMER, CHRISTIAN;HOHLE, CHRISTOPH;SEBALD, MICHAEL;ROTTSTEGGE, JOERG
分类号 G03F7/004;G03F7/039;(IPC1-7):G03F7/039 主分类号 G03F7/004
代理机构 代理人
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