发明名称 Projection exposure method and apparatus
摘要 A projection exposure apparatus comprises a projection optical system for projecting a pattern of a mask on a photosensitive substrate; a plane-parallel plate disposed on a side of the photosensitive substrate of the projection optical system, almost perpendicularly to an optical axis of the projection optical system; and a adjustment device for adjusting at least one of an inclination angle of a normal line of the plane-parallel plate relative to the optical axis of the projection optical system and an inclination angle of the plane-parallel plate.
申请公布号 US6522390(B2) 申请公布日期 2003.02.18
申请号 US20010819724 申请日期 2001.03.29
申请人 NIKON CORPORATION 发明人 SUZUKI KOUSUKE;ONDA MINORU
分类号 G03F7/20;(IPC1-7):G03B27/52;G03B27/32;G02B27/14 主分类号 G03F7/20
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