发明名称 |
Projection exposure method and apparatus |
摘要 |
A projection exposure apparatus comprises a projection optical system for projecting a pattern of a mask on a photosensitive substrate; a plane-parallel plate disposed on a side of the photosensitive substrate of the projection optical system, almost perpendicularly to an optical axis of the projection optical system; and a adjustment device for adjusting at least one of an inclination angle of a normal line of the plane-parallel plate relative to the optical axis of the projection optical system and an inclination angle of the plane-parallel plate.
|
申请公布号 |
US6522390(B2) |
申请公布日期 |
2003.02.18 |
申请号 |
US20010819724 |
申请日期 |
2001.03.29 |
申请人 |
NIKON CORPORATION |
发明人 |
SUZUKI KOUSUKE;ONDA MINORU |
分类号 |
G03F7/20;(IPC1-7):G03B27/52;G03B27/32;G02B27/14 |
主分类号 |
G03F7/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|