发明名称 Semiconductor device including memory cells and manufacturing method thereof
摘要 In a semiconductor device having memory cells and peripheral circuits, the memory cells and the peripheral circuits are formed on a semiconductor substrate. Source regions, drain regions and gate electrodes of MOS transistors in the peripheral circuits are comprised of a refractory metallic silicide layer. Gate electrodes of MOS transistors in the memory cells are comprised of the refractory metallic silicide. Source and drain regions of the MOS transistors in the memory cells are not comprised of the refractory metallic silicide layer.
申请公布号 US6521955(B1) 申请公布日期 2003.02.18
申请号 US20000671210 申请日期 2000.09.28
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 IDA JIRO;NAKAYAMA NAOKO
分类号 H01L21/28;H01L21/336;H01L21/768;H01L21/8234;H01L21/8242;H01L27/088;H01L27/108;H01L29/72;H01L29/78;(IPC1-7):H01L29/72 主分类号 H01L21/28
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