发明名称 AN IMPROVED HIGH DENSITY MEMORY CELL
摘要 A memory cell comprising an inverting stage, an access transistor coupled between a data line and an input of the inverting stage, the access transistor being responsive to a control signal for selectively coupling the data line and the inverting stage input, a feedback transistor coupled to the inverting stage input and being responsive to an output of the inverting stage for latching the inerting stage in a first logic state and whereby the cell is maintained in a second logic state by a leakage current flowing through the access transistor which is greater than a current flowing through the feedback transistor.
申请公布号 KR20030014364(A) 申请公布日期 2003.02.17
申请号 KR20027011589 申请日期 2001.03.05
申请人 发明人
分类号 G11C11/40;G11C11/41;G11C11/412;G11C15/04;H01L21/8244;H01L27/11 主分类号 G11C11/40
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