发明名称 METHOD AND DEVICE FOR FOCUS MONITOR, AND MANUFACTURING METHOD OF SEMICONDUCTOR
摘要 PURPOSE: To provide a method and a device for focus monitor which have a high detection sensitivity in the z direction and don't require replacement of an illumination aperture and to provide a manufacturing method of a semiconductor device. CONSTITUTION: The focus monitor method uses modified illumination to transfer the pattern of a photo mask 5 for phase shift focus monitor to a photo resist 21b on a semiconductor substrate 21a. The photo mask 5 for phase shift focus monitor has first and second light transmission parts 5c and 5d adjacent to each other across a light shielding pattern 5b between them and is so constituted that a phase difference other than 180°may be given for respective exposure light transmitted through the first and second light transmission parts 5c and 5d.
申请公布号 KR20030014336(A) 申请公布日期 2003.02.17
申请号 KR20020025170 申请日期 2002.05.08
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MAEJIMA SHINROKU;MIYAMOTO YUKI;NAKAO SHUJI
分类号 G03F1/08;G02B7/28;G03F1/30;G03F1/44;G03F1/68;G03F7/207;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F1/08
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