HANDLER FOR TESTING SEMICONDUCTOR DEVICE

摘要

PURPOSE: A handler for testing a semiconductor device is provided to compactly form a free-sizing device and exactly perform a free-sizing operation when picking up and supplying a semiconductor device of a user tray to a test tray. CONSTITUTION: A user tray supplies a device for a testing target. A pitch changing pick up device picks up and loads the device from the user tray to a test tray. A free-sizing unit is arranged at a main frame so that the pitch changing pick up device performs an exact operation. A base panel(31) is slidingly arranged at a main frame(1). A buffer tray(33) is arranged at the base panel(31). A device of a user tray is supplied and stored in the buffer tray(33). A plurality of pockets is formed at a centering jig(34). The centering jig(34) is arranged at the base panel(31) together with the buffer tray(33). Each of the pockets has the same pitch as that of a pocket pitch of a test tray. A driver(32) drives the base panel(31). When the driver(32) drives the base panel(31), a guide portion guides the base panel(31) to perform a rectilinear motion.