发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PURPOSE: To provide a semiconductor device improved in drain breakdown voltage. CONSTITUTION: This semiconductor device is constituted by forming a P-type well region 5 in a P-type semiconductor substrate 1, at least a thick gate insulating film 9 and a thin gate insulating film 10 on the region 5, and a gate electrode (25E) via the gate insulating films 9 and 10. The impurity injected into a portion below the electrode (25E) through ion implantation for adjusting threshold voltage is injected only into the lower part of the thick gate insulating film 10 in this invention.
申请公布号 KR20030014157(A) 申请公布日期 2003.02.15
申请号 KR20020047053 申请日期 2002.08.09
申请人 SANYO ELECTRIC CO., LTD. 发明人 KIKUCHI SHUICHI;MOMEN MASAAKI
分类号 G02F1/1345;G02F1/1368;H01L21/8238;H01L27/092;H01L29/78;(IPC1-7):H01L29/78 主分类号 G02F1/1345
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