发明名称 Spatial array pattern alignment method in fabric processing, involves adjusting position of matching pattern within marker so as to align pattern of work material within boundary defined by matching and reference patterns
摘要 The images of a work material (26) spread on support surface at reference and match points, are captured, superimposed and projected onto a display. One of the images at reference point is moved relative to images at matching point for image alignment. The position of matching pattern within marker is adjusted so as to align work material pattern within the boundary defined by the matching and reference patterns.
申请公布号 FR2828383(A1) 申请公布日期 2003.02.14
申请号 FR20020010153 申请日期 2002.08.09
申请人 GERBER TECHNOLOGY INC 发明人 RAPOZA THOMAS;ZINK ANDREW;MONROE JEFFREY
分类号 D06H7/00;B26D5/00;G06T7/00 主分类号 D06H7/00
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