DEBUGGING CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT, AND DEBUGGING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To shorten time required for debugging a semiconductor integrated circuit, which has a plurality of functional circuits inside and to which only a small number of pins for debugging allocated. SOLUTION: The debugging efficiency of the semiconductor integrated circuit is enhanced by providing a flexible scheduler 10 by which scheduling is performed according to debugging use in the semiconductor integrated circuit 100. In addition, further enhancement of the debugging efficiency is possible by storing traces of an internal signal in an internal memory separately from a signal to be outputted to the outside of the semiconductor integrated circuit.