NON-CONTACT IC CARD, INLET FOR NON-CONTACT IC CARD, AND METHOD FOR INSPECTING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide an inlet for a non-contact IC card which is inexpensive and also can be efficiently inspected even in a state where a plurality of card surfaces are attached. SOLUTION: In a method for inspecting the inlet for non-contact IC card provided at least with a loop antenna and an IC, IC inspection is performed with an inspection probe brought into contact with the IC while at least one portion of the loop antenna is unconnected and the IC is connected to the loop antenna, loop antenna inspection is performed with the loop antenna brought into contact with the inspection probe, and finally, the unconnected part of the loop antenna is connected.