| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory in which replacement can be performed by the other redundant memory cell even when defect is found in a redundant memory cell replaced for a defective memory cell, and yield in manufacturing chips can be improved. SOLUTION: This memory is provided with a circuit 2 in which correspondence to a redundant memory cell selecting circuit 3 of a redundancy program circuit 1 is switched to a new redundant memory cell selecting circuit 3, a function of the redundant memory cell selecting circuit 3 previously corresponding is made inactive, in the case a redundant memory cell replaced for relieving a defective memory cell is defective.
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