发明名称 METHOD AND DEVICE FOR SELECTING SEMICONDUCTOR LASER
摘要 PROBLEM TO BE SOLVED: To provide a method and device for selecting semiconductor laser by which the propriety of the temperature characteristic of a semiconductor laser can be discriminated easily at an ordinary temperature. SOLUTION: The device is provided with means (2 and 3) which raise the light output of a semiconductor laser 4 to a rated value by supplying a driving current to the laser 4, means (2 and 3) which hold the driving current at the moment the light output rises to the rated value for a prescribed period of time, and a means 5 which measures the dropped amount of the light output of the laser 4 after the prescribed period of time has elapsed. The device is also provided with a means 8 which compares the dropped amount of the light output with a prescribed threshold and a means 8 which selects the semiconductor laser 4 as defective when the dropped amount is larger than the threshold.
申请公布号 JP2003046175(A) 申请公布日期 2003.02.14
申请号 JP20010230182 申请日期 2001.07.30
申请人 SONY CORP 发明人 INOUE HIROYUKI
分类号 G01M11/00;H01S5/00;(IPC1-7):H01S5/00 主分类号 G01M11/00
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