发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide the manufacturing method of a semiconductor device that removes the resist easily after ion implantation by solving the problem that kinetic energy in ion collision is converted to heat for heating a substrate and formed objects on the substrate, since ions are accelerated by a high electric field for implanting into the substrate in the ion implantation, and a resist surface is deteriorated and cured by heating at high temperature substantially. SOLUTION: The method should include a process for removing a resist mask after a process for injecting ions of a rare gas element. In addition, as other methods, the method should include a first process for injecting the ions of an impurity element where conductivity is given, a second process for injecting the ions of the rare gas element, and a process for removing the resist mask after the first and second processes.</p>
申请公布号 JP2003045858(A) 申请公布日期 2003.02.14
申请号 JP20020104435 申请日期 2002.04.05
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 HAYAKAWA SHIGENORI
分类号 G02F1/1368;H01L21/027;H01L21/266;H01L21/3065;H01L21/336;H01L29/786;(IPC1-7):H01L21/306;G02F1/136 主分类号 G02F1/1368
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