| 摘要 |
When specimens are illuminated in a scanning microscope, it is often necessary to use radiations of different wavelengths in order to examine the sample. A device and a method for illumination of specimens in a scanning microscope is proposed, a laser being used to generate a laser beam, and an optical system being used to image the laser beam onto the specimen. The optical system comprises a switchable beam deflection device that can direct the laser beam onto the specimen either along a first beam path or along an alternative beam path. In addition, a device for frequency conversion is arranged in the beam path of the alternative beam path.
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