发明名称 X-RAY INSPECTION USING SPATIALLY AND SPECTRALLY TAILORED BEAMS
摘要 <p>A system and method for inspecting an object, the system and method comprising a source for generating a penetrating radiation beam for irradiating the object, the beam having, for each instant of time, an instantaneous energy spectrum of intensity, a shaper for modulating the generated beam, thereby creating a shaped beam, the shaper comprising at least a first section and a second section, the first section attenuating the intensity of a portion of the generated beam by a first attenuation factor and the second section attenuating the intensity of another portion of the generated beam by a second attenuation factor, and at least one detector for detecting the shaped beam after the shaped beam interacts with the object. The source may scan a beam across an object while the source and at least one detector are moving on a platform capable of highway travel or on an inspection module movable with respect to the object.</p>
申请公布号 WO2003012414(A1) 申请公布日期 2003.02.13
申请号 US2002023948 申请日期 2002.07.26
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