发明名称 PROBING SYSTEM AND CAPACITANCE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a probing system which can remove the influence of stray a capacitance and carry out high-precision measurement. SOLUTION: This is a probing system equipped with a prober 1 and a capacitance measuring circuit 6. The prober 1 has a sealed box 11, and a signal cable 7 whose one end (its internal conductor 72) as a detecting probe comes in contact with a sample to be measured and is covered with an external conductor 71. The measuring circuit 6 has a voltage follower (an operational amplifier 61) whose non-inversion input terminal is connected to the internal conductor 72 of the signal cable, 7, and whose output terminal is connected to the external conductor 71, a resistor (R3) 67 whose one end is connected to the internal conductor 72, and an operational amplifier 60 whose output terminal is connected to the other end of the resistor (R3) 67 so that the resistor (R3) 67 and the operational amplifier 61 are included in the negative feedback route.
申请公布号 JP2003043079(A) 申请公布日期 2003.02.13
申请号 JP20010233814 申请日期 2001.08.01
申请人 SUMITOMO METAL IND LTD 发明人 YAKABE MASAMI;IKEUCHI NAOKI
分类号 G01R1/06;G01R27/26;H01L21/66;(IPC1-7):G01R27/26 主分类号 G01R1/06
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