发明名称 FILM THICKNESS MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a film thickness measuring method capable of obtaining satisfactory measurement results by correcting measurement errors at the traveling location of a film and resolving the errors in the on-line thickness measurement of the film. SOLUTION: In the on-line film thickness measuring method provided with a means for measuring the traveling location of the plastic film, measurement errors due to a thickness meter and variations in the traveling location of the film are controlled.
申请公布号 JP2003042744(A) 申请公布日期 2003.02.13
申请号 JP20010227332 申请日期 2001.07.27
申请人 TEIJIN LTD 发明人 NOHIRA TAKEYA
分类号 G01B21/08;(IPC1-7):G01B21/08 主分类号 G01B21/08
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