发明名称 TESTING DEVICE AND CALIBRATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a testing device and its calibration method for efficiently carrying out calibration of a diver, a comparator, and the like in the testing device for an electronic device and the like. SOLUTION: This calibration method for the testing device, which is provided with a first input/output part having a plurality of first drivers and a second input/output part having a plurality of driver comparators, includes a step of calibrating a reference comparator previously decided among a plurality of comparators in the second input/output part, a step of calibrating a plurality of first drivers respectively on the basis of the reference comparator, a step of calibrating a plurality of comparators respectively on the basis of a reference driver previously decided among a plurality of first drivers, and a step of calibrating second drivers corresponding to a plurality of comparators, respectively.
申请公布号 JP2003043124(A) 申请公布日期 2003.02.13
申请号 JP20010232930 申请日期 2001.07.31
申请人 ADVANTEST CORP 发明人 SHIROYAMA KOICHI;ICHIHASHI TOSHIHIRO
分类号 G01R35/00;G01R31/28;G01R31/3183;(IPC1-7):G01R35/00;G01R31/318 主分类号 G01R35/00
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