发明名称 PHASE TECHNIQUE FOR DETERMINING THICKNESS, VOLUME AND REFRACTIVE INDEX
摘要 <p>Method and apparatus for determining a parameter of a sample (S) such as a cell is disclosed. The method and apparatus detect phase data relating to the same by detecting light reflected or transmitted through the sample (S) by a CCD array (30). Processor (40) manipulates the phase data with other known characteristics of the sample to determine the required parameter.</p>
申请公布号 WO2003012407(A1) 申请公布日期 2003.02.13
申请号 AU2002000985 申请日期 2002.07.24
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