DISPLAY INSPECTING APPARATUS, DISPLAY INSPECTING METHOD AND PARASITIC CAPACITANCE INSPECTING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a technology for accurately evaluating the parasitic capacitance ratio accompanying with individual pixels. SOLUTION: The apparatus comprises a signal feeder 4 for outputting a voltage signal controlled by a controller 8 to be fed to pixel electrodes; a light intensity detector 5 for detecting the light intensity of a part corresponding to the pixel electrodes on a liquid crystal cell substrate 2; and a computer 31 having a CPU for obtaining the variation quantity of the pixel voltage, based on the variation of the light intensity of the pixel electrode corresponding part detected by the detector 5, when a switching element is set from the ON state to the OFF state for controlling whether the voltage signal is fed to the pixel electrodes. The ratio of a parasitic capacitance of the pixel to the total capacitance is obtained from the variation of the pixel voltage obtained by the computer 31.