发明名称 THERMAL DESORPTION ANALYTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To improve thermal desorption analytical precision by uniformly heating a sample. SOLUTION: This thermal desorption analytical device is equipped with a sample holder for mounting the sample thereon, a sample chamber for arranging the sample holder in the inside, an infrared heating furnace for heating from the periphery, the sample arranged in the sample chamber in the mounted state on the sample holder, a measuring means for detecting gas desorbed from the sample through heating, and an evacuation means for evacuating the sample chamber, a soaking means (a soaking substrate 13 and a soaking hood 14) for soaking the heat by infrared rays, released from the infrared heating furnace via an absorption medium, and heating the sample by secondary radiation, installed near the sample arranged in the sample chamber in a mounted state on the sample holder 10. The soaking means is formed from molybdenum, tantalum, tungsten, or an alloy composed mainly of at least one among them.
申请公布号 JP2003042980(A) 申请公布日期 2003.02.13
申请号 JP20010229076 申请日期 2001.07.30
申请人 RIGAKU CORP 发明人 ARII TADASHI
分类号 G01N25/00;(IPC1-7):G01N25/00 主分类号 G01N25/00
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