| 摘要 |
PROBLEM TO BE SOLVED: To shorten a development term for an inspection program and to provide a semiconductor integrated circuit reducing troubles such as erroneous determination of a good/defective product. SOLUTION: This semiconductor integrated circuit 100 is provided with a plurality of input/output terminals 105 and 106, each of which serves as an output in an ordinary operation mode and serves as an input in an inspection mode, a plurality of comparison circuits 111 and 112 comparing an output signal of an output buffer with an output expectation value signal inputted from the input/output terminals in the inspection mode, a determination circuit 113 determining output signals from a plurality of comparison circuits 111 and 112, and an output terminal 114 for the determination signal.
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