发明名称 PHASE TECHNIQUE FOR DETERMINING THICKNESS, VOLUME AND REFRACTIVE INDEX
摘要 Method and apparatus for determining a parameter of a sample (S) such as a cell is disclosed. The method and apparatus detect phase data relating to the same by detecting light reflected or transmitted through the sample (S) by a CCD array (30). Processor (40) manipulates the phase data with other known characteristics of the sample to determine the required parameter.
申请公布号 WO03012407(A1) 申请公布日期 2003.02.13
申请号 WO2002AU00985 申请日期 2002.07.24
申请人 IATIA IMAGING PTY LTD;ALLMAN, BRENDAN, EDWARD;NUGENT, KEITH;BARONE-NUGENT, ERIOA;HARRIS, PETER, JEFFREY 发明人 ALLMAN, BRENDAN, EDWARD;NUGENT, KEITH;BARONE-NUGENT, ERIOA;HARRIS, PETER, JEFFREY
分类号 G01B11/06;G01N21/45;(IPC1-7):G01N21/41;G01J9/00;G01N33/483 主分类号 G01B11/06
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