发明名称 |
METHOD FOR CLEANING SEMICONDUCTOR DEVICE USING LASER |
摘要 |
PURPOSE: A method for cleaning a semiconductor device using laser is provided to reduce a time for cleaning process by minimizing the scanning number of a semiconductor substrate. CONSTITUTION: A semiconductor substrate(104) is transferred into a cleaning chamber(100). The semiconductor substrate(104) is loaded by a rotation and transfer unit(102). A laser beam irradiation device(106) irradiates a line laser beam(110) on a surface of the semiconductor substrate(104) through a laser beam irradiation hole(108). The energy of the line laser beam(110) is controlled according to thermal characteristics of elements formed on the semiconductor substrate(104). In a cleaning process, particles are separated from the semiconductor substrate(104). An adhesion of the particles on the semiconductor substrate(104) is prevented by using a purge gas(112). The gas generated from the cleaning chamber is exhausted to an exhaust hole(114).
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申请公布号 |
KR20030012364(A) |
申请公布日期 |
2003.02.12 |
申请号 |
KR20010046361 |
申请日期 |
2001.07.31 |
申请人 |
HANTECH CO., LTD. |
发明人 |
KIM, DAE JIN;KIM, HYEON JUNG;KIM, YONG GI;RYU, JE GIL |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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