发明名称 |
APPARATUS FOR ETCHING WAFER |
摘要 |
PURPOSE: An apparatus for etching a wafer is provided to restrain the inflow of external air into a reaction chamber and generation of particles by forming a fixing type uniformity ring. CONSTITUTION: A distribution plate(20) is used for injecting a reaction gas into the inside of a process chamber(10). An electrostatic chuck(30) is used for chucking a wafer. A uniformity ring(40) is installed on an upper portion of the electrostatic chuck(30). A guide portion(41) of the uniformity ring(40) is projected from an upper portion of the uniformity ring(40). A support portion(42) of the uniformity ring(40) is fixed to the process chamber(10) by using a pin(70). The support portion(42) is loaded on upper end portions of an edge ring(50) and a ground ring(60). The height of an upper end portion of the guide portion(41) is lower than that of a bottom face of a blade of a transferring robot.
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申请公布号 |
KR20030012478(A) |
申请公布日期 |
2003.02.12 |
申请号 |
KR20010046507 |
申请日期 |
2001.08.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG MAN |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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